Debug and Trace on NXP S32K3xx


Speakers: Manish Kumar, Applications Engineer, iSYSTEM Germany


Watch the webinar!


Who should attend:

Embedded software developers, system architects, software integrators, and test engineers who want to get a basic understanding of the debug and trace capabilities of the NXP S32K3xx series microcontrollers. This webinar solely focuses on S32K3xx microcontrollers used in the automotive domain.


Why should you attend:

This webinar explains the debug and trace architecture and features of the NXP S32K3xx series microcontrollers; shows how a debugger connects to a target for debugging and trace and discusses various configuration options for debugging use-cases. A live demo, using the winIDEA Trace Analyzer demonstrates the NXP S32K3xx trace capabilities using different use cases such as program flow trace, data trace, function profiling, etc., and the required tool setup.




We empower embedded software engineers to do it right!

Our BlueBox Technology stands for fast and easy microcontroller access via any kind of debug interface. Complemented with integrated development and test software winIDEA/testIDEA it provides access to on-target timing information. Embedded software engineers can review application timing, analyze real-time operating system states, and undertake code coverage to prove that their products do what they were built to do.


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