Infineon AURIX™ Microcontrollers

A mainstay of the automotive industry, the AURIX™ controllers are found in safety-critical and processing intensive applications. These devices are used in applications as diverse as advanced driver assistance systems, airbags, power steering, chassis domains and braking systems, to name just a few.

iSYSTEM provides comprehensive debug and trace support for the entire Infineon AURIX Controller Family. iSYSTEM's BlueBox On-Chip Analyzers compliment the AURIX™ family support with their IOM Accessories, available for a range of BlueBox products. Timing measurements are possible using the iC5700 together with an Active Probe and, by linking in the CAN/LIN IOM Accessory, vehicle network traffic can be added to the mix. Complex AUTOSAR applications can be analyzed and optimized to ensure that timing constraints are fulfilled.

Document Description
AURIX Trace Overview and Use-CasesThe application note provides an overview of the on-chip trace architecture and capabilities of the Infineon AURIX micro controller family
Synchronous Debug & Trace on two Infineon AURIX devices

This application note describes how to configure the iSYSTEM winIDEA IDE and Debugger for synchronous debug and trace of two AURIX devices

AURIX Architecture
Figure 1: Simplified, generic AURIX Debug/Trace Block Diagram

 

Features:

  • Debug Access via JTAG and DAP
  • On-Chip FLASH Programming
  • Debug support for TriCore, HSM and SCR
  • Single-/Multi-Core Debug & Trace
  • MCDS Trace support on Emulation Device
    • Trace Storage in Emulation Memory
    • Trace Streaming, i.e. “Upload-While-Sample” (UWS), via DAP
    • Trace Streaming via AGBT
  • MiniMCDS Trace support on Production Devices

BlueBox Solutions

Connection to the target Base Unit Picture

JTAG/DAP Debug & Trace
16-Pin 2.54 mm

Infineon JTAG Adaptor

iC5000, iC5700

DAP Trace & Debug
10-Pin 1.27 mm

Infineon DAP Adaptor

iC5000, iC5700

DAP (+DAPE) Debug & Trace Active Probe
10-Pin 1.27 mm

Infineon AURIX DAP2/DAPE Active Probe

iC5700

AGBT Trace & Debug 22-Pin ERF8 Samtec

Active Probe AGBT

iC5700

AGBT Trace & Debug
22-Pin ERF8 Samtec

Infineon AURORA Adaptor

iC6000

Typical Debug/Trace Configurations

Debug Only - iC5000

  • Basic and compact System
  • Debug Access via JTAG/DAP
  • Optional Trace Support (EMEM, DAP, DAP UWS) on Emulation Devices
  • Optional IOM2 Analog/Digital I/O Module

 

Debug Only - iC5000
Figure 2: Sample Debug/Trace Tool Configuration based on iC5000

Debug + Trace via EMEM/DAP - iC5700 (+DAP Active Probe)

  • High-Performance, versatile System
  • Debug Access via JTAG/DAP
  • Trace Support via on-chip EMEM and DAP Streaming (“UWS”)
  • Optional DAP Active Probe for high-speed DAP Operation (up to 160MHz) DAP + DAPE Support for TC3x Family
  • Optional IOM6 Add-On Modules (ADIO, CAN/LIN)

 

Debug + Trace via EMEM/DAP - iC5700 (+DAP Active Probe)
Figure 3: Sample Tool Configuration for Debug and EMEM/DAP Tracing based on iC5700

Debug + Trace via AGBT - iC5700 + Infineon AGBT Active Probe

  • Highest Trace Performance, versatile System. Ideally suited for long-term multi-core Program & OS Trace
  • Debug Access via JTAG/DAP
  • Trace Support via on-chip EMEM or high-speed AGBT Streaming
  • Optional IOM6 Add-On Modules (ADIO, CAN/LIN) Allows for synchronized Debug with multiple iSYSTEM BlueBox Systems (iC5700 + Infineon AGBT Active Probes)

 

Sample iSYSTEM BlueBox Configuration based on iC5700 + Infineon AGBT Active Probe
Figure: Sample iSYSTEM BlueBox Configuration based on iC5700 + Infineon AGBT Active Probe

Debug + Trace via AGBT - iC6000

  • Highest Trace Performance Ideally suited for long-term multi-core Program & OS Trace
  • Debug Access via JTAG/DAP
  • Trace Support via on-chip EMEM or high-speed AGBT Streaming

 

Debug + Trace via AGBT - iC6000
Figure 4: Sample Tool Configuration for Debug and AGBT Tracing based on iC6000

DAP Active Probe for i5700

  • DAP Operation at maximum 160MHz (dependent on Target Board Layout)
  • Optional Support for DAPE on TC3x Family Emulation Devices DAP and DAPE can operate at different Clock Rates.
  • Compact & Robust Design
  • Up to 5m FNet Cable to iC5700

 

DAP Active Probe for iC5700
Figure 5: DAP Active Probe connected to DAP and DAPE Interface on TC3x TriBoard

AURIX-specific Trace Use-Cases

DAP Streaming „Upload-while-Sampling“ (UWS)

  • Allows Upload of Trace Data from EMEM to Host PC (winIDEA) while Trace Recording is running.
  • If Upload Bandwith > Trace Data Generation Rate => UWS can run infinitely
  • Ideally suited for (long-term) OS Profiling
  • DAP Active Probe allows DAP Operation at maximum 160MHz for optimized Streaming Bandwidth
  • A minimum of 2 (better 3) EMEM Tiles need to be available for Trace.

 

DMA Trace

The winIDEA Trace Analyzer allows full utilization of the extremely versatile configuration options of the AURIX MCDS on-chip Trace functionality. This allows, for instance, tracing of SRI bus transactions of specific bus masters such as the DMA controller along with the CPU instruction trace or OS task trace.

 

DAP Streaming and DMA Trace
Figure 6: Sample Profiler Timeline of OS Task and DMA Transaction Trace

Trace of CPU Performance Counters

The winIDEA Trace Analyzer allows full utilization of the extremely versatile configuration options of the AURIX MCDS on-chip Trace functionality.

This allows, for instance, a real-time trace of the CPU-internal performance counters, measuring performance parameters such as Instruction Execution rate, Cache Hit/Miss rates, etc.

 

Trace of CPU Performance Counters
Figure 7: Sample Profiler Timeline of combined Code and Performance Counter Trace measuring Instruction Execution Rate (with disabled Instruction Cache)

Compact Function Trace (CFT)

CFT is a feature of the MCDS Processor Observation Block (POB). Its goal is to reduce trace bandwidth, while providing ability to trace function execution. Trace messages are only generated upon a function call and function return. Also indirect calls (e.g. Interrupt Service Routines) generate a trace message.

This concept brings big savings especially when long functions are executed, as all instruction execution inside the function generates no trace data. However, the CFT concept relies on consistent function call-return sequences. Certain compiler optimizations “violate” this constraint and thus CFT-based function profiling may not be applicable.

 

Compact Function Trace
Figure 8: AUTOSAR OS & Runnable Profiling combined with CFT-based Function Profiling

ADIO & CAN Trace

A trace recording via DAP Upload-While-Sampling (UWS) allows a time correlation with Analog/Digital or CAN/LIN bus signals captured by means of the ADIO and/or CAN/LIN Add-On Module of the iC5700.

 

ADIO and CAN/LIN Trace
Figure 9: AUTOSAR Task & Runnable Profile combined (correlated) with CAN Frames/Signals captured from a CAN bus

If you require further help to understand which BlueBox On-Chip Analyzer would best suit your needs, why not get in touch using the contact link on the right.

CAN/LIN Add-On Contact