Renesas Synergy™ Microcontrollers
With their Synergy™ microcontroller family, Renesas has developed four series of MCUs for use in end-products ranging from small mobile devices to larger, high performance calculation intensive applications. The Renesas Synergy™ MCUs in each series are all part of the same family and are feature and pin compatible, allowing easy scalability and code reuse from one device to another.
Blazing fast processor core plus secure connectivity and industry-leading large memory sizes opens up developers' design options for connected IoT applications, breaking through limitations previously faced by developers and engineering teams.
A secure connectivity suite, large memory and serial memory expansion, high-accuracy analog, TFTLCD graphics with 2D engine and many built-in safety functions make S5 Series MCUs ready for extremely capable embedded control applications across the board.
Enhanced CPU processing power, secure connectivity, advanced analog and timing control, safety self-test features, segment LCD and capacitive touch control, all built on a very low power silicon process are prime ingredients for smart IoT sensors and localized control.
Ultra-low power MCUs enable incredibly long battery life in portable or non-portable applications that must survive a long time in standby mode. The S1 Series MCUs allow that without sacrificing analog capabilities, secure connectivity, or robust safety.
iSYSTEM - Enabling Safer Embedded Systems
iSYSTEM's BlueBox technology from iSYSTEM is ideally suited to embedded development on the Renesas Synergy™ family of microcontrollers. Simply start with either the "e2 studio" or make use of the "IAR EW for Synergy™" development environments to develop a binary for downloading onto the target. From there you can make used of iSYSTEM's suite of software for debugging, program trace and testing. All of the Synergy™ family feature various forms of program trace, making it possible to perform code coverage and timing profiling of your application. Where functional safety is of concern, both testIDEA and our isystem.connect SDK can be used to test software and system functionality.
|DWT (Data Watchpoint and Trace)||Hardware comparators for program counter
and data watchpoints
|FPB (Flash Patch Breakpoint)||Implements hardware breakpoints||✔||✔||✔||✔||✔||✔||✔||✘|
|ETB (Embedded Trace Buffer)||Reserves SRAM to store trace information on-chip||✘||✔||✘||✘||✘||✔||✔||✘|
|ETM (Embedded Trace Macrocell)||5-pin output for ITM or ETM trace messages||✘||✘||✔||✔||✘||✔||✔||✘|
|MTB (Micro Trace Buffer)||Reserves SRAM to store trace information on-chip||✔||✘||✘||✘||✘||✔||✔||✘|
|SWO (Serial Wire Output)||Single-pin output for ITM trace messages||✘||✔||✔||✔||✔||✔||✔||✘|
|TPIU (Trace Port Interface Unit)||Bridge between on-chip trace data and either
SWO or ETM interfaces.
|SWD (Serial Wire Debug)||Two-wire CoreSight™ interface used for debugging
and debug configuration.
1) In conjunction with winIDEA Open, the functionality of the J-Link is limited to debugging