iSYSTEM testIDEA – Test Use-Cases including real Hardware Signals
Most embedded applications run in conjunction with different electrical signals of external hardware. The relationship between the embedded software and hardware signal activities are relevant during development, system integration, and testing.
This webinar discusses and demos embedded software testing, combined with the analysis and generation of hardware signal stimuli.
iSYSTEM provides an Analog-Digital I/O (ADIO) module which extends the iSYSTEM debugger hardware to a signal generation, a measurement, and a timing analysis tool. Using the iSYSTEM on-target test tool testIDEA, a system/integration test with coverage measurement can be created. During the test execution, the test stimulus signals will be invoked. The iSYSTEM winIDEA Trace Analyzer will capture and display the hardware signals along with the program coverage measurement. Furthermore, a technology called iSYSTEM Profiler Inspectors, used for event-chain / timing analysis, will be introduced. At the end, we will demonstrate the iSYSTEM API for automated testing via scripting.
Who:
Ales Kosir, Field Application Engineer, iSYSTEM Labs
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About iSYSTEM
We empower embedded software engineers to do it right!
Our BlueBox Technology stands for fast and easy microcontroller access via any kind of debug interface. Complemented with integrated development and test software winIDEA/testIDEA it provides access to on-target timing information. Embedded software engineers can review application timing, analyze real-time operating system states, and undertake code coverage to prove that their products do what they were built to do.
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