Duration: 

35 minutes + questions

Who: 

Ales Kosir, Field Application Engineer, iSYSTEM Labs

When: 

• Thursday, March 10th,  9 am CET  / 1.30 pm IST / 4 am CST (UTC+1) → R E G I S T E R   H E R E

 

• Thursday, March 10th, 4 pm CET / 10 am EST (UTC+1) → R E G I S T E R   H E R E

 

• Thursday, March 10th , 8 pm CET / 2 pm EST / 11 am PST (UTC+1) →R E G I S T E R   H E R E

 

Who should attend?

Test Engineers, Software Integrators, System Architects, Embedded Software Developers, and everybody who is interested in end-to-end timing measurement.

Why should you attend? 

Most embedded applications run in conjunction with different electrical signals of external hardware. The relationship between the embedded software and hardware signal activities are relevant during development, system integration, and testing.

This webinar will discuss and demo embedded software testing, combined with the analysis and generation of hardware signal stimuli.

iSYSTEM provides an Analog-Digital I/O (ADIO) module which extends the iSYSTEM debugger hardware to a signal generation, a measurement, and a timing analysis tool. Using the iSYSTEM on-target test tool testIDEA, a system/integration test with coverage measurement can be created. During the test execution, the test stimulus signals will be invoked. The iSYSTEM winIDEA Trace Analyzer will capture and display the hardware signals along with the program coverage measurement. Furthermore, a technology called iSYSTEM Profiler Inspectors, used for event-chain / timing analysis, will be introduced. At the end, we will demonstrate the iSYSTEM API for automated testing via scripting.